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Technische Universität Dresden
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Bereich Mathematik und Naturwissenschaften
Fachrichtung Physik
Institut Festkörper- und Materialphysik
Professur für Festkörperphysik
Fast fourier transform and multi-Gaussian fitting of XRR data
Fast Fourier transform and multi-Gaussian fitting of XRR data to determine the thickness of ALD grown thin films within the initial growth regime
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Home
Technische Universität Dresden
Bereiche
Bereich Mathematik und Naturwissenschaften
Fachrichtung Physik
Institut Festkörper- und Materialphysik
Professur für Festkörperphysik
Fast fourier transform and multi-Gaussian fitting of XRR data
Fast Fourier transform and multi-Gaussian fitting of XRR data to determine the thickness of ALD grown thin films within the initial growth regime
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