Crack monitoring with DFOS: Distributed strain measurements with various DFOS/adhesive combinations and model development for strain peak prediction

Documentation of the data
datacite.description.TechnicalInfo

Python scripts: (i) An algorithm to predict strain peaks for single cracks. To test the algorithm, two examples are provided. (ii) A script for deriving design charts (nomograms) that illustrate the interplay between DAC sensitivity, gage pitch, and the maximum measurable crack width. (iii) A graphical user interface (GUI) enables the simulation of strain curves for different stabilized crack patterns. This allows users to make informed decisions regarding DAC selection for crack monitoring applications.

References to related material
datacite.relatedItem.IsSupplementTo

Max Herbers, Bertram Richter, Steffen Marx: "Systematic sensor selection for distributed fiber optic crack monitoring: A semi-analytical model for strain peak prediction"

Description of the data
datacite.resourceType

Data from strain measurements with distributed fiber optic sensors (DFOS): Five different DFOS/adhesive combinations (DACs) were used to measure crack formation in concrete elements. The recorded strain profiles were analyzed to characterize the specific bond behavior between the optical fiber and the host material. Based on the derived bond laws, a semi-analytical model was developed that allows the prediction of strain distributions as a function of crack pattern, DAC-specific bond characteristics, and measurement settings. Further information can be found in the README.

Type of the data
datacite.resourceTypeGeneral

Dataset

Type of the data
datacite.resourceTypeGeneral

Model

Type of the data
datacite.resourceTypeGeneral

Software

Total size of the dataset
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61346686

Author
dc.contributor.author

Herbers, Max

Author
dc.contributor.author

Richter, Bertram

Author
dc.contributor.author

Marx, Steffen

Upload date
dc.date.accessioned

2025-07-10T14:38:57Z

Publication date
dc.date.available

2025-07-10T14:38:57Z

Publication date
dc.date.issued

2025-07-10

Abstract of the dataset
dc.description.abstract

Coherent optical frequency domain reflectometry (c-OFDR) enables continuous and automated crack monitoring in concrete structures due to its high spatial resolution and long sensing range. However, the selection of a suitable DFOS/adhesive combination (DAC) remains a key challenge and is typically based on empirical knowledge. As a result, the monitoring quality is highly dependent on the user’s experience. Inappropriate choices can result in undetected cracks, degraded signal quality, miscalculated crack widths, or even fiber breakage. This study proposes a semi-analytical model for predicting strain curves for arbitrary crack patterns, based on experimentally derived parameters, such as sensitivity, strain lag parameter, and the extent of bond disturbance due to transverse cracking. The model was validated using strain measurements from tests on reinforced concrete specimens with multiple cracks. With only a few input parameters, it enables accurate representation of crack-induced strain peaks and allows for the consideration of measurement limitations typical for c-OFDR systems. Based on this, design charts and an open source software tool were developed to support practitioners in the systematic selection of DACs, tailored to the expected crack pattern.

Public reference to this page
dc.identifier.uri

https://opara.zih.tu-dresden.de/handle/123456789/1572

Public reference to this page
dc.identifier.uri

https://doi.org/10.25532/OPARA-892

Publisher
dc.publisher

Technische Universität Dresden

Licence
dc.rights

Attribution 4.0 Internationalen

URI of the licence text
dc.rights.uri

http://creativecommons.org/licenses/by/4.0/

Specification of the discipline(s)
dc.subject.classification

4

Title of the dataset
dc.title

Crack monitoring with DFOS: Distributed strain measurements with various DFOS/adhesive combinations and model development for strain peak prediction

Research instruments
opara.descriptionInstrument

ODiSI 6100 manufactured by Luna Inc.

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