Auflistung Fast Fourier transform and multi-Gaussian fitting of XRR data to determine the thickness of ALD grown thin films within the initial growth regime nach Titel
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Jupyter notebook code and example file for the evaluation of XRR data via FFT
(Technische Universität DresdenIFW Dresden, 2020)This is supplementary information to the publication: "Fast fourier transform and multi-Gaussian fitting of XRR data to determine the thickness of ALD grown thin films within the initial growth regime"